Time management is very much important in IIT JAM. The eduncle test series for IIT JAM Mathematical Statistics helped me a lot in this portion. I am very thankful to the test series I bought from eduncle.
Nilanjan Bhowmick AIR 3, CSIR NET (Earth Science)
Anshum Sharma
X-ray diffraction (XRD) methods and techniques, as applied to material characterization problems and samples, are reviewed. Conventional and synchrotron X-ray sources are discussed, and the application of XRD methods to structure and phase determination, as well as stress and strain, multilayer composition and morphology, and semiconductor characterization are presented.